TY  - GEN
AU  - Tanaka, Nobuo,
CN  - QH212.T7
DO  - 10.1007/978-4-431-56502-4
DO  - doi
ID  - 780806
KW  - Transmission electron microscopy.
KW  - Scanning transmission electron microscopy.
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-4-431-56502-4
SN  - 9784431565024
SN  - 4431565027
T1  - Electron nano-imaging :basics of imaging and diffraction for TEM and STEM /
TI  - Electron nano-imaging :basics of imaging and diffraction for TEM and STEM /
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-4-431-56502-4
ER  -