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000780806 020__ $$a9784431565024$$q(electronic book)
000780806 020__ $$a4431565027$$q(electronic book)
000780806 020__ $$z9784431565000
000780806 0247_ $$a10.1007/978-4-431-56502-4$$2doi
000780806 035__ $$aSP(OCoLC)ocn982373291
000780806 035__ $$aSP(OCoLC)982373291
000780806 040__ $$aGW5XE$$beng$$erda$$epn$$cGW5XE$$dYDX$$dOCLCF$$dUAB
000780806 049__ $$aISEA
000780806 050_4 $$aQH212.T7
000780806 08204 $$a502.8/25$$223
000780806 1001_ $$aTanaka, Nobuo,$$eauthor.
000780806 24510 $$aElectron nano-imaging :$$bbasics of imaging and diffraction for TEM and STEM /$$cNobuo Tanaka.
000780806 264_1 $$aTokyo, Japan :$$bSpringer,$$c2017.
000780806 300__ $$a1 online resource (xxviii, 333 pages) :$$billustrations.
000780806 336__ $$atext$$btxt$$2rdacontent
000780806 337__ $$acomputer$$bc$$2rdamedia
000780806 338__ $$aonline resource$$bcr$$2rdacarrier
000780806 504__ $$aIncludes bibliographical references and indexes.
000780806 506__ $$aAccess limited to authorized users.
000780806 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed April 10, 2017).
000780806 650_0 $$aTransmission electron microscopy.
000780806 650_0 $$aScanning transmission electron microscopy.
000780806 852__ $$bebk
000780806 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-4-431-56502-4$$zOnline Access$$91397441.1
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000780806 980__ $$aEBOOK
000780806 980__ $$aBIB
000780806 982__ $$aEbook
000780806 983__ $$aOnline
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