000783838 000__ 02048cam\a22004331i\4500 000783838 001__ 783838 000783838 005__ 20210515130654.0 000783838 006__ m\\\\\o\\d\\\\\\\\ 000783838 007__ cr\ununnnunnun 000783838 008__ 170709s2017\\\\flua\\\\ob\\\\001\0\eng\d 000783838 020__ $$a9781351751049 (electronic bk.) 000783838 020__ $$a1351751042 (electronic bk.) 000783838 020__ $$z9781498783590 000783838 020__ $$z1498783597 000783838 035__ $$a(NhCcYBP)EBC4890680 000783838 040__ $$aNhCcYBP$$cNhCcYBP 000783838 050_4 $$aTK7871.95$$b.K38 2017 000783838 08204 $$a621.3815/284$$223 000783838 1001_ $$aKaushik, Brajesh Kumar,$$eauthor. 000783838 24510 $$aSpacer engineered FinFET architectures :$$bhigh-performance digital circuit applications /$$cBrajesh Kumar Kaushik, Sudeb Dasgupta, Pankaj Kumar Pal. 000783838 264_1 $$aBoca Raton, FL :$$bCRC Press, Taylor & Francis Group,$$c[2017] 000783838 300__ $$a1 online resource (xvi, 138 pages.) 000783838 336__ $$atext$$btxt$$2rdacontent 000783838 337__ $$acomputer$$bc$$2rdamedia 000783838 338__ $$aonline resource$$bcr$$2rdacarrier 000783838 504__ $$aIncludes bibliographical references and index. 000783838 5050_ $$aIntroduction to nanoelectronics -- Tri-gate FinFET technology and its advancement -- Dual-K spacer device architectures and its electrostatics -- Capacitive analysis & dual-K FinFET based digital circuit design -- Design metric improvement of dual-K based SRAM cell -- Statistical variability & sensitivity analysis. 000783838 506__ $$aAccess limited to authorized users 000783838 533__ $$aElectronic reproduction.$$bAnn Arbor, MI$$nAvailable via World Wide Web. 000783838 588__ $$aDescription based on print version record. 000783838 650_0 $$aMetal oxide semiconductor field-effect transistors. 000783838 650_0 $$aSilicon-on-insulator technology. 000783838 7001_ $$aDasgupta, Sudeb,$$eauthor. 000783838 7001_ $$aPal, Pankaj Kumar,$$eauthor. 000783838 7102_ $$aProQuest (Firm) 000783838 77608 $$cOriginal$$z9781498783590$$z1498783597$$w(DLC) 2016051118 000783838 852__ $$bebk 000783838 85640 $$3GOBI DDA$$uhttps://univsouthin.idm.oclc.org/login?url=http://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=4890680$$zOnline Access 000783838 909CO $$ooai:library.usi.edu:783838$$pGLOBAL_SET 000783838 980__ $$aEBOOK 000783838 980__ $$aBIB 000783838 982__ $$aEbook 000783838 983__ $$aOnline