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000805078 020__ $$z9781119027119
000805078 020__ $$z111902711X
000805078 020__ $$z9781119027140
000805078 020__ $$a9781119027126$$q(electronic book)
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000805078 035__ $$a(Au-PeEL)EBL4529314
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000805078 035__ $$a(OCoLC)942611368
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000805078 050_4 $$aTK7871$$b.B748 2016
000805078 0820_ $$a621.381$$223
000805078 1001_ $$aBrillson, L. J.,$$eauthor.
000805078 24513 $$aAn essential guide to electronic material surfaces and interfaces /$$cLeonard J. Brillson, Ohio State University.
000805078 264_1 $$aHoboken, New Jersey :$$bJohn Wiley & Sons, Incorporated,$$c2016.
000805078 300__ $$a1 online resource (379 pages) :$$bcolor illustrations
000805078 336__ $$atext$$2rdacontent
000805078 337__ $$acomputer$$2rdamedia
000805078 338__ $$aonline resource$$2rdacarrier
000805078 504__ $$aIncludes bibliographical references and index.
000805078 5050_ $$aWhy surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces.
000805078 506__ $$aAccess limited to authorized users.
000805078 520__ $$a"An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them. Starting with the fundamental electronic properties of semiconductors and electrical measurements of semiconductor interfaces, this text introduces students to the importance of characterizing and controlling macroscopic electrical properties by atomic-scale techniques. The chapters that follow present the full range of surface and interface techniques now being used to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth for students to master the fundamental principles, with numerous examples to illustrate the strengths and limitations for specific applications. As well as references to the most authoritative sources for broader discussions, the text includes internet links to additional examples, mathematical derivations, tables, and literature references for the advanced student, as well as professionals in these fields. This textbook fills a gap in the existing literature for an entry-level course that provides the physical properties, experimental techniques, and theoretical methods essential for students and professionals to understand and participate in solid-state electronics, physics, and materials science research"--$$cProvided by publisher.
000805078 588__ $$aDescription based on print version record.
000805078 650_0 $$aElectronics$$xMaterials.
000805078 650_0 $$aSurfaces (Technology)$$xAnalysis.
000805078 650_0 $$aSpectrum analysis.
000805078 650_0 $$aSemiconductors$$xMaterials.
000805078 77608 $$iPrint version:$$aBrillson, L. J.$$tEssential guide to electronic material surfaces and interfaces.$$dHoboken, New Jersey : John Wiley & Sons, Incorporated, 2016$$z9781119027140
000805078 852__ $$bebk
000805078 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=4529314$$zOnline Access
000805078 909CO $$ooai:library.usi.edu:805078$$pGLOBAL_SET
000805078 980__ $$aEBOOK
000805078 980__ $$aBIB
000805078 982__ $$aEbook
000805078 983__ $$aOnline