VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers / Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh (eds.).
2017
TK7874.75
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Citation
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Details
Title
VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers / Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh (eds.).
Meeting Name
ISBN
9789811074707 (electronic book)
9811074704 (electronic book)
9789811074691
9811074704 (electronic book)
9789811074691
Published
Singapore : Springer, 2017.
Language
English
Description
1 online resource (xxi, 815 pages) : illustrations.
Item Number
10.1007/978-981-10-7470-7 doi
Call Number
TK7874.75
Dewey Decimal Classification
621.39/5
Note
Includes author index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed January 4, 2018).
Series
Communications in computer and information science ; 711. 1865-0929
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