@article{823862,
      author = {Brodusch, Nicolas, and Demers, Hendrix, and Gauvin,  Raynald,},
      url = {http://library.usi.edu/record/823862},
      title = {Field emission scanning electron microscopy : new  perspectives for materials characterization /},
      abstract = {This book highlights what is now achievable in terms of  materials characterization with the new generation of  cold-field emission scanning electron microscopes applied  to real materials at high spatial resolution. It discusses  advanced scanning electron microscopes/scanning-  transmission electron microscopes (SEM/STEM), simulation  and post-processing techniques at high spatial resolution  in the fields of nanomaterials, metallurgy, geology, and  more. These microscopes now offer improved performance at  very low landing voltage and high -beam probe current  stability, combined with a routine transmission mode  capability that can compete with the (scanning-)  transmission electron microscopes (STEM/-TEM) historically  run at higher beam accelerating voltage.},
      doi = {https://doi.org/10.1007/978-981-10-4433-5},
      recid = {823862},
      pages = {1 online resource.},
}