TY  - GEN
N2  - This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
DO  - 10.1007/978-981-10-4433-5
DO  - doi
AB  - This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
T1  - Field emission scanning electron microscopy :new perspectives for materials characterization /
AU  - Brodusch, Nicolas,
AU  - Demers, Hendrix,
AU  - Gauvin, Raynald,
CN  - TA417.23
ID  - 823862
KW  - Scanning electron microscopy.
KW  - Materials
SN  - 9789811044335
SN  - 9811044333
TI  - Field emission scanning electron microscopy :new perspectives for materials characterization /
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-10-4433-5
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-10-4433-5
ER  -