000823862 000__ 02672cam\a2200493Ii\4500
000823862 001__ 823862
000823862 005__ 20230306144053.0
000823862 006__ m\\\\\o\\d\\\\\\\\
000823862 007__ cr\cn\nnnunnun
000823862 008__ 171005s2018\\\\si\\\\\\ob\\\\000\0\eng\d
000823862 019__ $$a1008876949$$a1011794514
000823862 020__ $$a9789811044335$$q(electronic book)
000823862 020__ $$a9811044333$$q(electronic book)
000823862 020__ $$z9789811044328
000823862 0247_ $$a10.1007/978-981-10-4433-5$$2doi
000823862 035__ $$aSP(OCoLC)on1005354030
000823862 035__ $$aSP(OCoLC)1005354030$$z(OCoLC)1008876949$$z(OCoLC)1011794514
000823862 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dGW5XE$$dN$T$$dNJR$$dAZU$$dOCLCF$$dCOO$$dUAB$$dU3W$$dCAUOI$$dSNK
000823862 049__ $$aISEA
000823862 050_4 $$aTA417.23
000823862 08204 $$a502.8/25$$223
000823862 1001_ $$aBrodusch, Nicolas,$$eauthor.
000823862 24510 $$aField emission scanning electron microscopy :$$bnew perspectives for materials characterization /$$cNicolas Brodusch, Hendrix Demers, Raynald Gauvin.
000823862 264_1 $$aSingapore :$$bSpringer,$$c[2018].
000823862 300__ $$a1 online resource.
000823862 336__ $$atext$$btxt$$2rdacontent
000823862 337__ $$acomputer$$bc$$2rdamedia
000823862 338__ $$aonline resource$$bcr$$2rdacarrier
000823862 347__ $$atext file$$bPDF$$2rda
000823862 4901_ $$aSpringerBriefs in applied sciences and technology,$$x2191-530X
000823862 504__ $$aIncludes bibliographical references.
000823862 506__ $$aAccess limited to authorized users.
000823862 520__ $$aThis book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
000823862 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed October 6, 2017).
000823862 650_0 $$aScanning electron microscopy.
000823862 650_0 $$aMaterials$$xTesting.
000823862 7001_ $$aDemers, Hendrix,$$eauthor.
000823862 7001_ $$aGauvin, Raynald,$$eauthor.
000823862 77608 $$iPrint version: $$z9789811044328
000823862 830_0 $$aSpringerBriefs in applied sciences and technology.
000823862 852__ $$bebk
000823862 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-10-4433-5$$zOnline Access$$91397441.1
000823862 909CO $$ooai:library.usi.edu:823862$$pGLOBAL_SET
000823862 980__ $$aEBOOK
000823862 980__ $$aBIB
000823862 982__ $$aEbook
000823862 983__ $$aOnline
000823862 994__ $$a92$$bISE