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Contactless VLSI Measurement and Testing Techniques.

Sayil, Selahattin.
2017
TK7874.75
Available Online
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Details

Title
Contactless VLSI Measurement and Testing Techniques.
Author
Sayil, Selahattin.
ISBN
9783319696737 (electronic book)
3319696734 (electronic book)
9783319696720
3319696726
Publication Details
Cham : Springer, 2017.
Language
English
Description
1 online resource (92 pages)
Call Number
TK7874.75
Dewey Decimal Classification
621.39/5
Access Note
Access limited to authorized users.
Source of Description
Description based on print version record.
Available in Other Form
Contactless VLSI Measurement and Testing Techniques.
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