TY  - GEN
T1  - Advances in feature selection for data and pattern recognition /
DA  - 2017.
CY  - Cham :
AU  - Stańczyk, Urszula.
AU  - Zielosko, Beata.
AU  - Jain, Lakhmi C.
VL  - v. 138
CN  - TK7882.P3
PB  - Springer,
PP  - Cham :
PY  - 2017.
ID  - 824694
KW  - Pattern recognition systems.
SN  - 9783319675886
SN  - 3319675885
TI  - Advances in feature selection for data and pattern recognition /
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-67588-6
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-67588-6
ER  -