Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
2018
QH212.S3
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Online Access
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Can lend chapters, not whole ebooks
Details
Title
Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
Edition
Fourth edition.
ISBN
9781493966769 (electronic book)
1493966766 (electronic book)
9781493966745
149396674X
1493966766 (electronic book)
9781493966745
149396674X
Published
New York, NY : Springer, 2018.
Language
English
Description
1 online resource (xxiii, 550 pages) : illustrations
Item Number
10.1007/978-1-4939-6676-9 doi
Call Number
QH212.S3
Dewey Decimal Classification
502.8/25
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Digital File Characteristics
text file PDF
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed November 29, 2017).
Added Author
Goldstein, Joseph, 1939- author.
Newbury, Dale E., author.
Michael, Joseph R., author.
Ritchie, Nicholas W. M. author.
Scott, John Henry J. author.
Joy, David C., 1943- author.
Newbury, Dale E., author.
Michael, Joseph R., author.
Ritchie, Nicholas W. M. author.
Scott, John Henry J. author.
Joy, David C., 1943- author.
Available in Other Form
Print version: 9781493966745
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Online Access
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