TY  - GEN
N2  - This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.
DO  - 10.1007/978-3-319-59573-3
DO  - doi
AB  - This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.
T1  - Industrial X-Ray Computed Tomography /
AU  - Carmignato, Simone.
AU  - Dewulf, Wim.
AU  - Leach, Richard.
CN  - RC78.7.T6
ID  - 826087
KW  - Materials science.
KW  - Atoms.
KW  - Physics.
KW  - Manufacturing industries.
KW  - Machinery.
KW  - Tools.
KW  - Optical materials.
KW  - Electronics
SN  - 9783319595733
SN  - 3319595733
SN  - 9783319595719
SN  - 3319595717
TI  - Industrial X-Ray Computed Tomography /
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-59573-3
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-59573-3
ER  -