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000826087 0247_ $$a10.1007/978-3-319-59573-3$$2doi
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000826087 050_4 $$aRC78.7.T6
000826087 08204 $$a620.11$$223
000826087 24500 $$aIndustrial X-Ray Computed Tomography /$$cedited by Simone Carmignato, Wim Dewulf, Richard Leach.
000826087 264_1 $$aCham :$$bSpringer International Publishing :$$bImprint: Springer,$$c2018.
000826087 300__ $$a1 online resource (v, 369 pages) :$$billustrations.
000826087 336__ $$atext$$btxt$$2rdacontent
000826087 337__ $$acomputer$$bc$$2rdamedia
000826087 338__ $$aonline resource$$bcr$$2rdacarrier
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000826087 5050_ $$aIntroduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications.
000826087 506__ $$aAccess limited to authorized users.
000826087 520__ $$aThis book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.
000826087 650_0 $$aMaterials science.
000826087 650_0 $$aAtoms.
000826087 650_0 $$aPhysics.
000826087 650_0 $$aManufacturing industries.
000826087 650_0 $$aMachinery.
000826087 650_0 $$aTools.
000826087 650_0 $$aOptical materials.
000826087 650_0 $$aElectronics$$xMaterials.
000826087 7001_ $$aCarmignato, Simone.
000826087 7001_ $$aDewulf, Wim.
000826087 7001_ $$aLeach, Richard.
000826087 77608 $$iPrint version: $$z9783319595719
000826087 852__ $$bebk
000826087 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-59573-3$$zOnline Access$$91397441.1
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000826087 983__ $$aOnline
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