TY  - GEN
AB  - This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
AU  - Stenzel, O.
AU  - Ohlídal, Miloslav,
CN  - QC176.84.O7
DO  - 10.1007/978-3-319-75325-6
DO  - doi
ID  - 826801
KW  - Thin films
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-75325-6
N2  - This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
SN  - 9783319753256
SN  - 3319753258
T1  - Optical characterization of thin solid films /
TI  - Optical characterization of thin solid films /
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-75325-6
VL  - volume 64
ER  -