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000826801 019__ $$a1028668633$$a1028805849
000826801 020__ $$a9783319753256$$q(electronic book)
000826801 020__ $$a3319753258$$q(electronic book)
000826801 020__ $$z9783319753249
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000826801 0247_ $$a10.1007/978-3-319-75325-6$$2doi
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000826801 050_4 $$aQC176.84.O7
000826801 08204 $$a621.3815/2$$223
000826801 24500 $$aOptical characterization of thin solid films /$$cedited by Olaf Stenzel, Miloslav Ohlídal, editors.
000826801 264_1 $$aCham, Switzerland :$$bSpringer,$$c2018.
000826801 300__ $$a1 online resource.
000826801 336__ $$atext$$btxt$$2rdacontent
000826801 337__ $$acomputer$$bc$$2rdamedia
000826801 338__ $$aonline resource$$bcr$$2rdacarrier
000826801 347__ $$atext file$$bPDF$$2rda
000826801 4901_ $$aSpringer series in surface sciences,$$x0931-5195 ;$$vvolume 64
000826801 504__ $$aIncludes bibliographical references and index.
000826801 5050_ $$aIntroduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.
000826801 506__ $$aAccess limited to authorized users.
000826801 520__ $$aThis book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
000826801 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed March 15, 2018).
000826801 650_0 $$aThin films$$xOptical properties.
000826801 7001_ $$aStenzel, O.$$q(Olaf),$$eeditor.
000826801 7001_ $$aOhlídal, Miloslav,$$eeditor.
000826801 77608 $$iPrint version: $$z331975324X$$z9783319753249$$w(OCoLC)1019610964
000826801 830_0 $$aSpringer series in surface sciences ;$$v64.
000826801 852__ $$bebk
000826801 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-75325-6$$zOnline Access$$91397441.1
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000826801 980__ $$aBIB
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