Optical characterization of thin solid films / edited by Olaf Stenzel, Miloslav Ohlídal, editors.
Stenzel, O. (Olaf), editor.; Ohlídal, Miloslav, editor.
2018
QC176.84.O7
Available Online

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Title
Optical characterization of thin solid films / edited by Olaf Stenzel, Miloslav Ohlídal, editors.
ISBN
9783319753256 (electronic book)
3319753258 (electronic book)
9783319753249
331975324X
DOI
https://doi.org/10.1007/978-3-319-75325-6
Published
Cham, Switzerland : Springer, 2018.
Language
English
Description
1 online resource.
Item Number
10.1007/978-3-319-75325-6 doi
Call Number
QC176.84.O7
Dewey Decimal Classification
621.3815/2
Summary
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Digital File Characteristics
text file PDF
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed March 15, 2018).
Added Author
Stenzel, O. (Olaf), editor.
Ohlídal, Miloslav, editor.
Series
Springer series in surface sciences ; 64.
Available in Other Form
Print version: 9783319753249
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Introduction and modelling activities
Optical film characterization topics: An overview
Universal dispersion model for characterization of optical thin films over wide spectral range
Predicting optical properties of oxides from ab initio calculations
Spectrophotometry and spectral ellipsometry
Optical characterization of thin films by means of spectroscopic imaging spectrophotometry
Data processing methods for imaging spectrophotometry
In-situ and ex-situ spectrophotometry in thin film characterization
Ellipsometric characterization of thin solid films
Characterization of defective and corrugated coatings
Optical characterization of thin films exhibiting defects
Scanning probe microscopy characterization of optical thin films
Resonant grating waveguide structures
Absorption and scatter
Roughness and scatter in optical coatings
Absorption and fluorescence measurements in optical coatings
Cavity ring-down technique for optical coating characterization.

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