Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization / edited by Sascha Sadewasser, Thilo Glatzel.

Part I: Technical aspects
Experimental technique and working modes
Dissipation KPFM
KPFM techniques for liquid environment
Open-loop and excitation KPFM
Quantitative KPFM on semiconductor devices
KPFM with atomic resolution
Part II: Theoretical Aspects
Local dipoles in atomic and Kelvin probe force microscopy
Influence of the tip electrostatic field on high resolution KPFM measurements
Modelling the electrostatic field of a cantilever
Theory of open-loop KPFM
KPFM in a SPM simulator
Electrostatic interactions with dielectric samples
Part III: Applications
Kelvin spectroscopy of single molecules
KPFM for single molecule chemistry
Optoelectronic properties of single molecules
Quantitative KPFM of molecular self-assemblies
Applications of KPFM in liquids
KPFM of organic solar cell materials
Correlation of optical and electrical nanoscale properties of organic devices
KPFM for catalysis
Quantitative electrical measurements of SiC devices.