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Intro; Preface; Acknowledgements; Contents; Part I Fault Attacks: A Preamble; 1 Introduction to Fault Attacks; 1.1 Introduction; 1.2 Fault Attacks and Fault Models; 1.2.1 Differential Fault Analysis (DFA); 1.2.2 Fault Sensitivity Analysis; 1.2.3 Differential Fault Intensity Analysis (DFIA); 1.2.4 Safe-Error Attacks (SEA) and Differential Behavior Analysis (DBA); 1.3 Fault Injection Techniques: Semi-invasive and Non-invasive Methodologies; 1.3.1 Spike Attacks; 1.3.2 Glitch Attacks; 1.3.3 Optical/Laser Attacks; 1.3.4 Electromagnetic Attacks; 1.4 Organization of the Book

2 Classical Fault Attacks on Public and Symmetric-Key Cryptosystems2.1 The Seminal Fault Attack on RSA; 2.2 Differential Fault Analysis of Block Ciphers; 2.2.1 The Basic Principle of DFA; 2.2.2 Permanent and Transient Faults; 2.2.3 Fault Models for DFA; 2.2.4 DFA on a Generic SPN Block Cipher; 2.2.5 Case Study: Differential Fault Analysis of the Advanced Encryption Standard; 2.2.6 DFA of AES-128 Using Multiple Byte Faults; 2.2.7 DFA of the AES-128 Key Schedule; 2.2.8 DFA of AES-192 and AES-256; 2.3 Differential Fault Analysis of Stream Ciphers; 2.3.1 A Brief Description of Grain-128

2.3.2 The DFA Attack Model2.3.3 Signature Generation; 2.3.4 Fault Location Determination; 2.3.5 Recovering the Internal State of the Cipher; 2.3.6 Experimental Results: Faults Generated in Hardware; 2.3.7 Probability of Identifying a Random Fault Location; 2.4 Summary; Part II Side-Channel Inspired and Assisted Fault Analysis Techniques; 3 Side-Channel Inspired Fault Analysis Techniques; 3.1 Fault Sensitivity Analysis of Block Ciphers; 3.1.1 General Attack Principle; 3.1.2 Formal Attack Procedure; 3.1.3 Advantages of FSA over DFA; 3.2 Differential Fault Intensity Analysis of Block Ciphers

3.2.1 The Fault Model for DFIA3.2.2 The General Attack Methodology; 3.2.3 Advantages of DFIA; 3.2.4 Case Study: DFIA on AES-128; 3.3 Chapter Summary; 4 Side-Channel Assisted Fault Analysis; 4.1 Introduction; 4.2 Chapter Preliminaries; 4.2.1 Overview of the PRESENT Block Cipher; 4.2.2 Associated Literature; 4.3 The Combined SCA and DFA of PRESENT; 4.3.1 Properties of the PRESENT Block Cipher; 4.3.2 Fault Model and Fault Location; 4.3.3 The Role of Side-Channel Analysis in Our Attack; 4.3.4 The Fault Propagation Characteristics; 4.3.5 The Key Recovery Process; 4.4 Experimental Results

4.4.1 The Combined SCA+FA Setup4.4.2 Determination of Fault Mask; 4.4.3 Key Recovery: Performance and Efficiency; 4.5 Discussion; 4.5.1 Extension to Other Rounds & Targets; 4.5.2 Extension to Other PRESENT-Like Block Ciphers; 4.5.3 Possible Countermeasures; 4.6 Summary; Part III Advanced Fault Analysis Techniques and Fault Analysis Automation; 5 Laser-Based Fault Injection on Microcontrollers; 5.1 Introduction; 5.2 Historical Development; 5.3 The Physics of Laser Fault Injection; 5.4 Device Decapsulation; 5.4.1 Chemical Techniques; 5.4.2 Mechanical Techniques; 5.5 Targeting a Microcontroller

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