Measurement, testing and sensor technology : fundamentals and application to materials and technical systems / Horst Czichos.
2018
TK7872.D48
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Details
Title
Measurement, testing and sensor technology : fundamentals and application to materials and technical systems / Horst Czichos.
Author
ISBN
9783319763859 (electronic book)
3319763857 (electronic book)
9783319763842
3319763849
3319763857 (electronic book)
9783319763842
3319763849
Published
Cham, Switzerland : Springer, 2018.
Language
English
Description
1 online resource (x, 213 pages) : color illustrations
Item Number
10.1007/978-3-319-76385-9 doi
Call Number
TK7872.D48
Dewey Decimal Classification
621.3815/36
Summary
This book presents the principles, methods and techniques to characterize materials and technical systems. The book is organized with concise text-graphics compilations in three parts: The first part describes the fundamentals of measurement, testing and sensor technology, including a survey of sensor types for dimensional metrology, kinematics, dynamics, and temperature. It describes also microsensors and embedded sensors. The second part gives an overview of materials and explains the application of measurement, testing and sensor technology to characterize composition, microstructure, properties and performance of materials as well as deterioration mechanisms and reliability. The third part introduces the general systems theory for the characterization of technical systems, exemplified by mechatronic and tribological systems. It describes technical diagnostics for structural health monitoring and performance control.
Bibliography, etc. Note
Includes bibliographical references and index.
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Access limited to authorized users.
Digital File Characteristics
text file PDF
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed April 18, 2018).
Available in Other Form
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Table of Contents
Fundamentals
Materials and their characterization
Technical Systems and their characterization.
Materials and their characterization
Technical Systems and their characterization.