TY  - GEN
AU  - Roll, Guntrade,
CN  - TK7871.95
ID  - 855269
KW  - Metal oxide semiconductor field-effect transistors.
LK  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=5223913
SN  - 9783832596668 
T1  - Leakage current and defect characterization of short channel MOSFETs /
TI  - Leakage current and defect characterization of short channel MOSFETs /
UR  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=5223913
VL  - 2
ER  -