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000855269 020__ $$z9783832532611
000855269 020__ $$a9783832596668 $$q(electronic book)
000855269 035__ $$a(MiAaPQ)EBC5223913
000855269 035__ $$a(Au-PeEL)EBL5223913
000855269 035__ $$a(CaPaEBR)ebr11539620
000855269 035__ $$a(OCoLC)1021809289
000855269 040__ $$aMiAaPQ$$beng$$erda$$epn$$cMiAaPQ$$dMiAaPQ
000855269 050_4 $$aTK7871.95$$b.R655 2014
000855269 0820_ $$a621.3815284$$223
000855269 1001_ $$aRoll, Guntrade,$$eauthor.
000855269 24510 $$aLeakage current and defect characterization of short channel MOSFETs /$$cGuntrade Roll.
000855269 264_1 $$aBerlin :$$bLogos Verlag Berlin,$$c[2014]
000855269 264_4 $$c©2014
000855269 300__ $$a1 online resource (242 pages).
000855269 336__ $$atext$$btxt$$2rdacontent
000855269 337__ $$acomputer$$bc$$2rdamedia
000855269 338__ $$aonline resource$$bcr$$2rdacarrier
000855269 4900_ $$aResearch at NaMLab ;$$v2
000855269 506__ $$aAccess limited to authorized users.
000855269 588__ $$aDescription based on print version record.
000855269 650_0 $$aMetal oxide semiconductor field-effect transistors.
000855269 77608 $$iPrint version:$$aRoll, Guntrade.$$tLeakage current and defect characterization of short channel MOSFETs.$$dBerlin : Logos Verlag Berlin, c2014 $$z9783832532611
000855269 852__ $$bebk
000855269 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=5223913$$zOnline Access
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