TY  - GEN
T1  - Lock-in thermography :basics and use for evaluating electronic devices and materials /
AU  - Breitenstein, O.
AU  - Warta, W.
AU  - Langenkamp, M.
ET  - Thrid edition.
VL  - volume 10
CN  - TK7870.25
ID  - 858130
KW  - Electronic apparatus and appliances
KW  - Electronic apparatus and appliances
KW  - Semiconductors
KW  - Thermography.
SN  - 9783319998251
SN  - 3319998250
TI  - Lock-in thermography :basics and use for evaluating electronic devices and materials /
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-99825-1
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-99825-1
ER  -