TY  - GEN
T1  - Multi-run memory tests for pattern sensitive faults /
AU  - Mrozek, Ireneusz,
CN  - TK7895.M4
ID  - 860015
KW  - Semiconductor storage devices
KW  - Computer storage devices
KW  - Random access memory
SN  - 9783319912042
SN  - 3319912046
TI  - Multi-run memory tests for pattern sensitive faults /
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-91204-2
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-91204-2
ER  -