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000860015 020__ $$a9783319912042$$q(electronic book)
000860015 020__ $$a3319912046$$q(electronic book)
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000860015 049__ $$aISEA
000860015 050_4 $$aTK7895.M4
000860015 08204 $$a621.38152$$223
000860015 1001_ $$aMrozek, Ireneusz,$$eauthor.
000860015 24510 $$aMulti-run memory tests for pattern sensitive faults /$$cIreneusz Mrozek.
000860015 264_1 $$aCham :$$bSpringer,$$c[2019]
000860015 264_4 $$c©2019
000860015 300__ $$a1 online resource.
000860015 336__ $$atext$$btxt$$2rdacontent
000860015 337__ $$acomputer$$bc$$2rdamedia
000860015 338__ $$aonline resource$$bcr$$2rdacarrier
000860015 504__ $$aIncludes bibliographical references and index.
000860015 506__ $$aAccess limited to authorized users.
000860015 588__ $$aOnline resource; title from PDF title page (viewed July 12, 2018).
000860015 650_0 $$aSemiconductor storage devices$$xTesting.
000860015 650_0 $$aComputer storage devices$$xTesting.
000860015 650_0 $$aRandom access memory$$xTesting.
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