Multi-run memory tests for pattern sensitive faults / Ireneusz Mrozek.
2019
TK7895.M4
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Linked Resource
Online Access
Concurrent users
Unlimited
Authorized users
Authorized users
Document Delivery Supplied
Can lend chapters, not whole ebooks
Details
Title
Multi-run memory tests for pattern sensitive faults / Ireneusz Mrozek.
Author
Mrozek, Ireneusz, author.
ISBN
9783319912042 (electronic book)
3319912046 (electronic book)
9783319912035
3319912046 (electronic book)
9783319912035
Published
Cham : Springer, [2019]
Copyright
©2019
Language
English
Description
1 online resource.
Call Number
TK7895.M4
Dewey Decimal Classification
621.38152
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (viewed July 12, 2018).
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Online Access
Record Appears in
Online Resources > Ebooks
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