Test generation of crosstalk delay faults in VLSI circuits / S. Jayanthy, M.C. Bhuvaneswari.
2019
TK7874.75
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Details
Title
Test generation of crosstalk delay faults in VLSI circuits / S. Jayanthy, M.C. Bhuvaneswari.
Author
ISBN
9789811324932 (electronic book)
981132493X (electronic book)
9789811324925
9811324921
981132493X (electronic book)
9789811324925
9811324921
Published
Singapore : Springer, [2019].
Language
English
Description
1 online resource (xi, 156 pages) : illustrations
Item Number
10.1007/978-981-13-2493-2 doi
Call Number
TK7874.75
Dewey Decimal Classification
621.39/5
Bibliography, etc. Note
Includes bibliographical references.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed September 25, 2018).
Added Author
Available in Other Form
Print version: 9789811324925
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