VLSI design and test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised selected papers / S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.).
VDAT (Symposium) (22nd : 2018 : Madurai, India); Rajaram, S., 1973- editor.; Balamurugan, N. B. editor.; Gracia Nirmala Rani, D. editor.; Singh, Virendra (Associate professor of electrical engineering), editor.
2019
TK7874.75
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Title
VLSI design and test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised selected papers / S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.).
Meeting Name
VDAT (Symposium) (22nd : 2018 : Madurai, India)
ISBN
9789811359507 (electronic book)
9811359504 (electronic book)
9789811359491
DOI
https://doi.org/10.1007/978-981-13-5950-7
Published
Singapore : Springer, 2019.
Language
English
Description
1 online resource (xviii, 722 pages) : illustrations.
Item Number
10.1007/978-981-13-5950-7 doi
Call Number
TK7874.75
Dewey Decimal Classification
621.39/5
Note
Includes author index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed January 29, 2019).
Added Author
Rajaram, S., 1973- editor.
Balamurugan, N. B. editor.
Gracia Nirmala Rani, D. editor.
Singh, Virendra (Associate professor of electrical engineering), editor.
Series
Communications in computer and information science ; 892.
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