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000862672 020__ $$a9789811359507$$q(electronic book)
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000862672 0247_ $$a10.1007/978-981-13-5950-7$$2doi
000862672 035__ $$aSP(OCoLC)on1083544208
000862672 035__ $$aSP(OCoLC)1083544208
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000862672 08204 $$a621.39/5$$223
000862672 1112_ $$aVDAT (Symposium)$$n(22nd :$$d2018 :$$cMadurai, India)
000862672 24510 $$aVLSI design and test :$$b22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised selected papers /$$cS. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.).
000862672 2463_ $$aVDAT 2018
000862672 264_1 $$aSingapore :$$bSpringer,$$c2019.
000862672 300__ $$a1 online resource (xviii, 722 pages) :$$billustrations.
000862672 336__ $$atext$$btxt$$2rdacontent
000862672 337__ $$acomputer$$bc$$2rdamedia
000862672 338__ $$aonline resource$$bcr$$2rdacarrier
000862672 4901_ $$aCommunications in computer and information science,$$x1865-0929 ;$$v892
000862672 500__ $$aIncludes author index.
000862672 506__ $$aAccess limited to authorized users.
000862672 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed January 29, 2019).
000862672 650_0 $$aIntegrated circuits$$xVery large scale integration$$xTesting$$vCongresses.
000862672 650_0 $$aIntegrated circuits$$xVery large scale integration$$xDesign and construction$$vCongresses.
000862672 7001_ $$aRajaram, S.,$$d1973-$$eeditor.
000862672 7001_ $$aBalamurugan, N. B.$$eeditor.
000862672 7001_ $$aGracia Nirmala Rani, D.$$eeditor.
000862672 7001_ $$aSingh, Virendra$$c(Associate professor of electrical engineering),$$eeditor.
000862672 830_0 $$aCommunications in computer and information science ;$$v892.
000862672 852__ $$bebk
000862672 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-13-5950-7$$zOnline Access$$91397441.1
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