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000868225 019__ $$a1099318618$$a1099770450
000868225 020__ $$a9783030046606$$q(electronic book)
000868225 020__ $$a3030046605$$q(electronic book)
000868225 020__ $$z9783030046590
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000868225 0247_ $$a10.1007/978-3-030-04660-6$$2doi
000868225 035__ $$aSP(OCoLC)on1098213772
000868225 035__ $$aSP(OCoLC)1098213772$$z(OCoLC)1099318618$$z(OCoLC)1099770450
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000868225 049__ $$aISEA
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000868225 08204 $$a629.47$$223
000868225 24500 $$aRadiation effects on integrated circuits and systems for space applications /$$cRaoul Velazco, Dale McMorrow, Jaime Estela, editors.
000868225 264_1 $$aCham, Switzerland :$$bSpringer,$$c2019.
000868225 300__ $$a1 online resource (ix, 401 pages) :$$billustrations 
000868225 336__ $$atext$$btxt$$2rdacontent
000868225 337__ $$acomputer$$bc$$2rdamedia
000868225 338__ $$aonline resource$$bcr$$2rdacarrier
000868225 347__ $$atext file$$bPDF$$2rda
000868225 5050_ $$aChapter1: Space and Radiation Environments -- Chapter2: System-Level Modeling and Analysis fo the Vulnerability of a Processor to SEU -- Chapter3: Single Event Effects Test Methods -- Chapter4: Characteristics and Applications of Pulsed-Laser-Induced Single-Event Effects -- Chapter5: Microprocessor Testing -- Chapter6: Fault Injection Methodologies -- Chapter7: Mitigation techniques and Error prediction applied in Multicore processors -- Chapter8: Improving reliability of multi/many-core processors by using NMR-MPar approach -- Chapter9: System Hardening and Real Applications -- Chapter10: Backward Error Recovery in SRAM based FPGA -- Chapter11: Development of a Hardened 150nm Standard Cell library -- Chapter12: COTS in Space: Constraints, Limitations and Disruptive Capability -- Chapter13: COTS & the NewSpace -- Chapter14: The Phoenix GPS Receiver for Rocket and Satellite Applications -- An Example for the Successful Utilization of COTS Technology in Space Projects -- Chapter15: Simulation-based Radiation Hardness Assurance for ATHENA-WFI -- Chapter16: COTS for Deep Space Missions.
000868225 506__ $$aAccess limited to authorized users.
000868225 520__ $$aThis book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA's in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.
000868225 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed April 24, 2019).
000868225 650_0 $$aSpace vehicles$$xElectronic equipment.
000868225 650_0 $$aElectronic apparatus and appliances$$xEffect of radiation on.
000868225 650_0 $$aIntegrated circuits.
000868225 7001_ $$aVelazco, Raoul,$$eeditor.
000868225 7001_ $$aMcMorrow, Dale,$$eeditor.
000868225 7001_ $$aEstela, Jaime,$$eeditor.
000868225 77608 $$iPrint version:$$z3030046591$$z9783030046590$$w(OCoLC)1057781882
000868225 852__ $$bebk
000868225 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-04660-6$$zOnline Access$$91397441.1
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000868225 980__ $$aEBOOK
000868225 980__ $$aBIB
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000868225 983__ $$aOnline
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