Bias temperature instability for devices and circuits / Tibor Grasser, editor.

Unlimited

Authorized users

Can lend chapters, not whole ebooks

Bias temperature instability for devices and circuits / Tibor Grasser, editor.

9781461479086
1461479088
9781461479093 (electronic book)
1461479096 (electronic book)

New York : Springer, ©2014.

English

1 online resource (xi, 810 pages) : illustrations

10.1007/978-1-4614-7909-3 doi

TK7871.85

537.6/221

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. It contains coverage of current research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Includes bibliographical references.

Access limited to authorized users.

text file PDF

Description based on print version record.

Print version: 9781306163330

Online Resources > Ebooks
All Resources