TY  - GEN
N2  - This three-book set constitutes the refereed proceedings of the Second International Conference on Recent Trends in Image Processing and Pattern Recognition (RTIP2R) 2018, held in Solapur, India, in December 2018. The 173 revised full papers presented were carefully reviewed and selected from 374 submissions. The papers are organized in topical sections in the tree volumes. Part I: computer vision and pattern recognition; machine learning and applications; and image processing. Part II: healthcare and medical imaging; biometrics and applications. Part III: document image analysis; image analysis in agriculture; and data mining, information retrieval and applications.
AB  - This three-book set constitutes the refereed proceedings of the Second International Conference on Recent Trends in Image Processing and Pattern Recognition (RTIP2R) 2018, held in Solapur, India, in December 2018. The 173 revised full papers presented were carefully reviewed and selected from 374 submissions. The papers are organized in topical sections in the tree volumes. Part I: computer vision and pattern recognition; machine learning and applications; and image processing. Part II: healthcare and medical imaging; biometrics and applications. Part III: document image analysis; image analysis in agriculture; and data mining, information retrieval and applications.
T1  - Recent trends in image processing and pattern recognition :Second International Conference, RTIP2R 2018, Solapur, India, December 21-22, 2018, revised selected papers.
AU  - Santosh, K. C.
AU  - Hegadi, Ravindra S.
VL  - 1037
CN  - TA1637
N1  - Includes index.
ID  - 913042
KW  - Image processing
KW  - Pattern recognition systems
SN  - 9789811391873
SN  - 9811391874
TI  - Recent trends in image processing and pattern recognition :Second International Conference, RTIP2R 2018, Solapur, India, December 21-22, 2018, revised selected papers.
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-13-9187-3
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-13-9187-3
ER  -