VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers / Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma (eds.).
VDAT (Symposium) (23rd : 2019 : Indore, India); Sengupta, Anirban, editor.; Dasgupta, Sudeb, editor.; Singh, Virendra (Associate professor of electrical engineering), editor.; Sharma, Rohit (Rohit Y.), editor.; Vishvakarma, Santosh Kumar, editor.
2019
TK7874.75
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Title
VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers / Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma (eds.).
Meeting Name
VDAT (Symposium) (23rd : 2019 : Indore, India)
ISBN
9789813297678 (electronic book)
9813297670 (electronic book)
9789813297661
DOI
https://doi.org/10.1007/978-981-32-9767-8
Published
Singapore : Springer, 2019.
Language
English
Description
1 online resource (xvi, 775 pages) : illustrations.
Item Number
10.1007/978-981-32-9767-8 doi
Call Number
TK7874.75
Dewey Decimal Classification
621.39/5
Note
Includes author index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed September 6, 2019).
Added Author
Sengupta, Anirban, editor.
Dasgupta, Sudeb, editor.
Singh, Virendra (Associate professor of electrical engineering), editor.
Sharma, Rohit (Rohit Y.), editor.
Vishvakarma, Santosh Kumar, editor.
Series
Communications in computer and information science ; 1066.
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