@article{913576,
      recid = {913576},
      author = {Sengupta, Anirban, and Dasgupta, Sudeb, and Singh,  Virendra and Sharma, Rohit and Vishvakarma, Santosh Kumar,},
      title = {VLSI design and test : 23rd International Symposium, VDAT  2019, Indore, India, July 4-6, 2019, Revised selected  papers /. VDAT (Symposium)},
      pages = {1 online resource (xvi, 775 pages) :},
      note = {Includes author index.},
      url = {http://library.usi.edu/record/913576},
      doi = {https://doi.org/10.1007/978-981-32-9767-8},
}