000914811 000__ 01581cam\a2200445Ia\4500 000914811 001__ 914811 000914811 005__ 20230306150544.0 000914811 006__ m\\\\\o\\d\\\\\\\\ 000914811 007__ cr\un\nnnunnun 000914811 008__ 190925s2020\\\\si\\\\\\ob\\\\000\0\eng\d 000914811 019__ $$a1121056641 000914811 020__ $$a9789811500466$$q(electronic book) 000914811 020__ $$a9811500460$$q(electronic book) 000914811 020__ $$z9789811500459 000914811 020__ $$z9811500452 000914811 035__ $$aSP(OCoLC)on1120969631 000914811 035__ $$aSP(OCoLC)1120969631$$z(OCoLC)1121056641 000914811 040__ $$aYDX$$beng$$cYDX$$dGW5XE 000914811 049__ $$aISEA 000914811 050_4 $$aQD921 000914811 08204 $$a548/.5$$223 000914811 1001_ $$aWang, Guilei. 000914811 24510 $$aInvestigation on SiGe selective epitaxy for source and drain engineering in 22 nm CMOS technology node and beyond /$$cGuilei Wang. 000914811 260__ $$aSingapore :$$bSpringer,$$c2020. 000914811 300__ $$a1 online resource 000914811 336__ $$atext$$btxt$$2rdacontent 000914811 337__ $$acomputer$$bc$$2rdamedia 000914811 338__ $$aonline resource$$bcr$$2rdacarrier 000914811 4901_ $$aSpringer theses 000914811 500__ $$a"Doctoral thesis accepted by Chinese Academy of Sciences, Beijing, China." 000914811 504__ $$aIncludes bibliographical references. 000914811 506__ $$aAccess limited to authorized users. 000914811 650_0 $$aEpitaxy. 000914811 650_0 $$aMetal oxide semiconductors, Complementary$$xMaterials. 000914811 77608 $$iPrint version: $$z9811500452$$z9789811500459$$w(OCoLC)1111660482 000914811 830_0 $$aSpringer theses. 000914811 852__ $$bebk 000914811 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-15-0046-6$$zOnline Access$$91397441.1 000914811 909CO $$ooai:library.usi.edu:914811$$pGLOBAL_SET 000914811 980__ $$aEBOOK 000914811 980__ $$aBIB 000914811 982__ $$aEbook 000914811 983__ $$aOnline 000914811 994__ $$a92$$bISE