TY - GEN AB - This book constitutes the refereed conference proceedings of the 24rd Iberoamerican Congress on Pattern Recognition, CIARP 2019, held in Havana, Cuba, in October 2019. The 70 papers presented were carefully reviewed and selected from 128 submissions. The papers are organized in topical sections named: Data Mining: Natural Language Processing and Text Mining; Image Analysis and Retrieval; Machine Learning and Neural Networks; Mathematical Theory of Pattern Recognition; Pattern Recognition and Applications; Signals Analysis and Processing; Speech Recognition; Video Analysis. AU - Nyström, Ingela, AU - Hernández Heredia, Yanio, AU - Milián Núñez, Vladimir, CN - Q337.5 DO - 10.1007/978-3-030-33904-3 DO - 10.1007/978-3-030-33 DO - doi ID - 916112 KW - Pattern recognition systems KW - Optical pattern recognition KW - Computer vision KW - Image processing LK - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-33904-3 N1 - International conference proceedings. N1 - Includes author index. N2 - This book constitutes the refereed conference proceedings of the 24rd Iberoamerican Congress on Pattern Recognition, CIARP 2019, held in Havana, Cuba, in October 2019. The 70 papers presented were carefully reviewed and selected from 128 submissions. The papers are organized in topical sections named: Data Mining: Natural Language Processing and Text Mining; Image Analysis and Retrieval; Machine Learning and Neural Networks; Mathematical Theory of Pattern Recognition; Pattern Recognition and Applications; Signals Analysis and Processing; Speech Recognition; Video Analysis. SN - 9783030339043 SN - 3030339041 T1 - Progress in pattern recognition, image analysis, computer vision, and applications :24th Iberoamerican Congress, CIARP 2019, Havana, Cuba, October 28-31, 2019, Proceedings / TI - Progress in pattern recognition, image analysis, computer vision, and applications :24th Iberoamerican Congress, CIARP 2019, Havana, Cuba, October 28-31, 2019, Proceedings / UR - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-33904-3 VL - 11896 ER -