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000917068 019__ $$a1129155341$$a1129394187
000917068 020__ $$a9783030307264$$q(electronic book)
000917068 020__ $$a3030307263$$q(electronic book)
000917068 020__ $$z9783030307257
000917068 020__ $$z3030307255
000917068 0247_ $$a10.1007/978-3-030-30726-4$$2doi
000917068 0247_ $$a10.1007/978-3-030-30
000917068 035__ $$aSP(OCoLC)on1127385385
000917068 035__ $$aSP(OCoLC)1127385385$$z(OCoLC)1129155341$$z(OCoLC)1129394187
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000917068 049__ $$aISEA
000917068 050_4 $$aTA347.C68
000917068 08204 $$a621.381$$223
000917068 24500 $$aNanoelectronic coupled problems solutions /$$cE. Jan W. ter Maten, Hans-Georg Brachtendorf, Roland Pulch, Wim Schoenmaker, Herbert De Gersem, editors.
000917068 264_1 $$aCham, Switzerland :$$bSpringer,$$c2019.
000917068 300__ $$a1 online resource (xxx, 587 pages) :$$billustrations.
000917068 336__ $$atext$$btxt$$2rdacontent
000917068 337__ $$acomputer$$bc$$2rdamedia
000917068 338__ $$aonline resource$$bcr$$2rdacarrier
000917068 4901_ $$aThe European Consortium for Mathematics in Industry ;$$v29
000917068 504__ $$aIncludes bibliographical references and index.
000917068 5050_ $$aEquations, discretizations -- Time integration for coupled problems -- Uncertainty quantification -- Model order reduction -- Robustness, reliability, ageing -- Testcases and measurements.
000917068 506__ $$aAccess limited to authorized users.
000917068 520__ $$aDesigns in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers: (1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing , a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms industrial applicability.
000917068 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed November 13, 2019).
000917068 650_0 $$aCoupled problems (Complex systems)
000917068 650_0 $$aNanoelectronics$$xMathematics.
000917068 7001_ $$aTer Maten, E. Jan W.,$$eeditor.
000917068 7001_ $$aBrachtendorf, Hans-Georg,$$eeditor.
000917068 7001_ $$aPulch, Roland,$$eeditor.
000917068 7001_ $$aSchoenmaker, Wim,$$d1954-$$eeditor.
000917068 7001_ $$aDe Gersem, Herbert,$$eeditor.
000917068 77608 $$iPrint version: $$z3030307255$$z9783030307257$$w(OCoLC)1111945176
000917068 830_0 $$aEuropean Consortium for Mathematics in Industry (Series) ;$$vv. 29.
000917068 852__ $$bebk
000917068 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-30726-4$$zOnline Access$$91397441.1
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000917068 980__ $$aBIB
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000917068 983__ $$aOnline
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