@article{921944,
      author = {Guo, Xinfei, and Stan, Mircea R.,},
      url = {http://library.usi.edu/record/921944},
      title = {Circadian rhythms for future resilient electronic systems  : accelerated active self-healing for integrated circuits  /},
      abstract = {This book describes methods to address wearout/aging  degradations in electronic chips and systems, caused by  several physical mechanisms at the device level. The  authors introduce a novel technique called accelerated  active self-healing, which fixes wearout issues by enabling  accelerated recovery. Coverage includes recovery theory,  experimental results, implementations and applications,  across multiple nodes ranging from planar, FD-SOI to  FinFET, based on both foundry provided models and  predictive models. Presents novel techniques, tested with  experiments on real hardware; Discusses circuit and system  level wearout recovery implementations, many of these  designs are portable and friendly to the standard design  flow; Provides circuit-architecture-system infrastructures  that enable the accelerated self-healing for future  resilient systems; Discusses wearout issues at both  transistor and interconnect level, providing solutions that  apply to both; Includes coverage of resilient aspects of  emerging applications such as IoT.},
      recid = {921944},
      pages = {1 online resource :},
}