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000921944 019__ $$a1106158632
000921944 020__ $$a9783030200510$$q(electronic book)
000921944 020__ $$a3030200515$$q(electronic book)
000921944 020__ $$z9783030200503
000921944 0248_ $$a10.1007/978-3-030-20
000921944 035__ $$aSP(OCoLC)on1104533349
000921944 035__ $$aSP(OCoLC)1104533349$$z(OCoLC)1106158632
000921944 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dEBLCP$$dN$T$$dLQU$$dGW5XE$$dOCLCF$$dUKMGB$$dOCLCQ
000921944 049__ $$aISEA
000921944 050_4 $$aTK7888.4
000921944 08204 $$a621.3815$$223
000921944 1001_ $$aGuo, Xinfei,$$eauthor.
000921944 24510 $$aCircadian rhythms for future resilient electronic systems :$$baccelerated active self-healing for integrated circuits /$$cXinfei Guo and Mircea R. Stan.
000921944 264_1 $$aCham, Switzerland :$$bSpringer,$$c[2020]
000921944 300__ $$a1 online resource :$$billustrations
000921944 336__ $$atext$$btxt$$2rdacontent
000921944 337__ $$acomputer$$bc$$2rdamedia
000921944 338__ $$aonline resource$$bcr$$2rdacarrier
000921944 504__ $$aIncludes bibliographical references and index.
000921944 506__ $$aAccess limited to authorized users.
000921944 520__ $$aThis book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.
000921944 588__ $$aOnline resource; title from PDF title page (viewed June 17, 2019).
000921944 650_0 $$aIntegrated circuits.
000921944 650_0 $$aIntegrated circuits$$xDesign and construction.
000921944 650_0 $$aMetal oxide semiconductor field-effect transistors.
000921944 650_0 $$aCircadian rhythms.
000921944 7001_ $$aStan, Mircea R.,$$eauthor.
000921944 852__ $$bebk
000921944 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-20051-0$$zOnline Access$$91397441.1
000921944 909CO $$ooai:library.usi.edu:921944$$pGLOBAL_SET
000921944 980__ $$aEBOOK
000921944 980__ $$aBIB
000921944 982__ $$aEbook
000921944 983__ $$aOnline
000921944 994__ $$a92$$bISE