Circadian rhythms for future resilient electronic systems : accelerated active self-healing for integrated circuits / Xinfei Guo and Mircea R. Stan.
2020
TK7888.4
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Online Access
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Unlimited
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Authorized users
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Can lend chapters, not whole ebooks
Details
Title
Circadian rhythms for future resilient electronic systems : accelerated active self-healing for integrated circuits / Xinfei Guo and Mircea R. Stan.
Author
Guo, Xinfei, author.
ISBN
9783030200510 (electronic book)
3030200515 (electronic book)
9783030200503
3030200515 (electronic book)
9783030200503
Published
Cham, Switzerland : Springer, [2020]
Language
English
Description
1 online resource : illustrations
Item Number
10.1007/978-3-030-20
Call Number
TK7888.4
Dewey Decimal Classification
621.3815
Summary
This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (viewed June 17, 2019).
Added Author
Stan, Mircea R., author.
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Online Access
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