TY  - GEN
N2  - The book compiles efficient design and test methodologies for the implementation of reversible logic circuits. The methodologies covered in the book are design approaches, test approaches, fault tolerance in reversible circuits and physical implementation techniques. The book also covers the challenges and the reversible logic circuits to meet these challenges stimulated during each stage of work cycle. The novel computing paradigms are being explored to serve as a basis for fast and low power computation.
DO  - 10.1007/978-981-13-8821-7
DO  - 10.1007/978-981-13-8
DO  - doi
AB  - The book compiles efficient design and test methodologies for the implementation of reversible logic circuits. The methodologies covered in the book are design approaches, test approaches, fault tolerance in reversible circuits and physical implementation techniques. The book also covers the challenges and the reversible logic circuits to meet these challenges stimulated during each stage of work cycle. The novel computing paradigms are being explored to serve as a basis for fast and low power computation.
T1  - Design and testing of reversible logic /
AU  - Singh, Ashutosh Kumar,
AU  - Fujita, Masahiro,
AU  - Mohan, Anand
VL  - volume 577
CN  - TK7868.L6
ID  - 922398
KW  - Logic circuits
KW  - Logic circuits
SN  - 9789811388217
SN  - 9811388210
SN  - 9811388202
SN  - 9789811388200
TI  - Design and testing of reversible logic /
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-13-8821-7
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-13-8821-7
ER  -