Silicon Analog Components : Device Design, Process Integration, Characterization, and Reliability / Badih El-Kareh, Lou N. Hutter.
2020
TK7874 .E4 2020eb
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Details
Title
Silicon Analog Components : Device Design, Process Integration, Characterization, and Reliability / Badih El-Kareh, Lou N. Hutter.
Author
El-Kareh, Badih.
Edition
2nd ed.
ISBN
9783030150853 (electronic book)
3030150852 (electronic book)
9783030150846
3030150852 (electronic book)
9783030150846
Published
Cham : Springer, 2020.
Language
English
Description
1 online resource (xlix, 648 pages) : illustrations
Item Number
10.1007/978-3-030-15
Call Number
TK7874 .E4 2020eb
Dewey Decimal Classification
621.3815
Summary
This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science. Enables engineers to understand analog device physics, and discusses important relations between process integration, device design, component characteristics, and reliability; Describes in step-by-step fashion the components that are used in analog designs, the particular characteristics of analog components, while comparing them to digital applications; Explains the second-order effects in analog devices, and trade-offs between these effects when designing components and developing an integrated process for their manufacturing.
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Access limited to authorized users.
Added Author
Hutter, Lou N.
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Online Access
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Table of Contents
The World Is Analog
Review of Single-Crystal Silicon Properties
PN Junctions
Rectifying and Ohmic Contacts
Bipolar and Junction Field-Effect Transistors
Analog/RF CMOS
High-Voltage and Power Transistors
Passive Components
Process Integration
Mismatch and Noise
Chip Reliability.
Review of Single-Crystal Silicon Properties
PN Junctions
Rectifying and Ohmic Contacts
Bipolar and Junction Field-Effect Transistors
Analog/RF CMOS
High-Voltage and Power Transistors
Passive Components
Process Integration
Mismatch and Noise
Chip Reliability.