Ageing of integrated circuits : causes, effects and mitigation techniques / Basek Halak, editor.
Halak, Basel.
2020
TA7874
Available Online

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Title Ageing of integrated circuits : causes, effects and mitigation techniques / Basek Halak, editor.
ISBN 9783030237813
3030237818
9783030237806
303023780X
DOI https://doi.org/10.1007/978-3-030-23781-3
Imprint Cham : Springer, ©2020.
Language English
Description 1 online resource (231 pages)
Other Standard Identifiers 10.1007/978-3-030-23781-3 doi
10.1007/978-3-030-23
Call Number TA7874
Dewey Decimal Classification 621.3815
Summary This book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading.
Note Includes index.
Access Note Access limited to authorized users.
Source of Description Description based on print version record.
Added Author Halak, Basel.
Available in Other Form Ageing of Integrated Circuits : Causes, Effects and Mitigation Techniques.
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Record Appears in Online Resources > Ebooks
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Chapter 1. Understanding Ageing Mechanisms
Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits
Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software
Chapter 4. Ageing Mitigation Techniques for SRAM Memories
Chapter 5. Ageing-aware Logic Synthesis
Chapter 6. On-Chip Ageing Monitoring and System Adaptation
Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers
Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.

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