TY  - GEN
AB  - This book gathers the proceedings of the 17th International Conference on Electrical Bioimpedance (ICEBI 2019), held on June 9-14, in Joinville, Santa Catarina, Brazil. The chapters cover the latest knowledge and developments concerning: sensors and instrumentation to measure bioimpendance, bioimpedance imaging techniques, theory and modeling and bioimpendance, as well as cutting-edge clinical applications of bioimpendance. All in all, this book provides graduate students and researchers with an extensive and timely snapshot of current research and challenges in the field of electrical bioimpendance, and a source of inspiration for future research and cross-disciplinary collaborations.
AU  - Bertemes-Filho, Pedro.
CN  - QP341
CY  - Singapore :
DA  - 2020.
DO  - 10.1007/978-981-13-3
ID  - 928712
KW  - Impedance, Bioelectric
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-13-3498-6
N2  - This book gathers the proceedings of the 17th International Conference on Electrical Bioimpedance (ICEBI 2019), held on June 9-14, in Joinville, Santa Catarina, Brazil. The chapters cover the latest knowledge and developments concerning: sensors and instrumentation to measure bioimpendance, bioimpedance imaging techniques, theory and modeling and bioimpendance, as well as cutting-edge clinical applications of bioimpendance. All in all, this book provides graduate students and researchers with an extensive and timely snapshot of current research and challenges in the field of electrical bioimpendance, and a source of inspiration for future research and cross-disciplinary collaborations.
PB  - Springer,
PP  - Singapore :
PY  - 2020.
SN  - 9789811334986
SN  - 9811334986
T1  - 17th International Conference on Electrical Bioimpedance :ICEBI 2019, Joinville, Santa Catarina, Brazil, 9-14 June 2019 /
TI  - 17th International Conference on Electrical Bioimpedance :ICEBI 2019, Joinville, Santa Catarina, Brazil, 9-14 June 2019 /
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-13-3498-6
VL  - v.72
ER  -