TY  - GEN
AB  - This volume provides allergy and dermatology specialists with a practical guide to the correct patch test methodology for their day-to-day clinical practice: it includes the latest available hapten series (standard series and integrative series), the golden rules for concentration and conservation of the haptens themselves, and the indispensable test equipment. The book, coming in a handy softcover format, is also nicely illustrated with over 100 full color pictures and tables. The contents focus on the interpretation of the epicutaneous test reading as well, relating to clinical relevance of the reactions and granting a correct management of the allergic patient. Practical Guide to Patch Testing will be of great value to all practicing allergists or dermatologists and professionals related.
AU  - Nettis, Eustachio.
AU  - Angelini, Gianni.
CN  - RL105
CY  - Cham :
DA  - 2020.
DO  - 10.1007/978-3-030-33873-2
DO  - doi
ID  - 929987
KW  - Skin
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-33873-2
N2  - This volume provides allergy and dermatology specialists with a practical guide to the correct patch test methodology for their day-to-day clinical practice: it includes the latest available hapten series (standard series and integrative series), the golden rules for concentration and conservation of the haptens themselves, and the indispensable test equipment. The book, coming in a handy softcover format, is also nicely illustrated with over 100 full color pictures and tables. The contents focus on the interpretation of the epicutaneous test reading as well, relating to clinical relevance of the reactions and granting a correct management of the allergic patient. Practical Guide to Patch Testing will be of great value to all practicing allergists or dermatologists and professionals related.
PB  - Springer,
PP  - Cham :
PY  - 2020.
SN  - 9783030338732
SN  - 3030338738
T1  - Practical guide to patch testing /
TI  - Practical guide to patch testing /
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-33873-2
ER  -