000932873 000__ 01670cam\a2200433Ia\4500 000932873 001__ 932873 000932873 005__ 20230306151631.0 000932873 006__ m\\\\\o\\d\\\\\\\\ 000932873 007__ cr\un\nnnunnun 000932873 008__ 200523s2020\\\\si\\\\\\ob\\\\000\0\eng\d 000932873 019__ $$a1155170239 000932873 020__ $$a9789811553486$$q(electronic book) 000932873 020__ $$a9811553483$$q(electronic book) 000932873 020__ $$z9811553475 000932873 020__ $$z9789811553479 000932873 035__ $$aSP(OCoLC)on1155317869 000932873 035__ $$aSP(OCoLC)1155317869$$z(OCoLC)1155170239 000932873 040__ $$aEBLCP$$beng$$cEBLCP$$dYDX$$dEBLCP$$dGW5XE 000932873 049__ $$aISEA 000932873 050_4 $$aTA418.9.T45 000932873 08204 $$a620.1/1$$223 000932873 1001_ $$aKasirga, T. Serkan. 000932873 24510 $$aThermal conductivity measurements in atomically thin materials and devices /$$cT. Serkan Kasirga. 000932873 260__ $$aSingapore :$$bSpringer,$$c2020. 000932873 300__ $$a1 online resource (62 pages). 000932873 336__ $$atext$$btxt$$2rdacontent 000932873 337__ $$acomputer$$bc$$2rdamedia 000932873 338__ $$aonline resource$$bcr$$2rdacarrier 000932873 4901_ $$aSpringerBriefs in Applied Sciences and Technology 000932873 504__ $$aIncludes bibliographical references. 000932873 506__ $$aAccess limited to authorized users. 000932873 588__ $$aDescription based on print version record. 000932873 650_0 $$aThin films$$xThermal properties. 000932873 77608 $$iPrint version:$$aKasirga, T. Serkan$$tThermal Conductivity Measurements in Atomically Thin Materials and Devices$$dSingapore : Springer,c2020$$z9789811553479 000932873 830_0 $$aSpringerBriefs in applied sciences and technology. 000932873 852__ $$bebk 000932873 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-15-5348-6$$zOnline Access$$91397441.1 000932873 909CO $$ooai:library.usi.edu:932873$$pGLOBAL_SET 000932873 980__ $$aEBOOK 000932873 980__ $$aBIB 000932873 982__ $$aEbook 000932873 983__ $$aOnline 000932873 994__ $$a92$$bISE