TY - GEN N2 - This book constitutes the refereed proceedings of the 14th IAPR International Workshop on Document Analysis Systems, DAS 2020, held in Wuhan, China, in July 2020. The 40 full papers presented in this book were carefully reviewed and selected from 57 submissions. The papers are grouped in the following topical sections: character and text recognition; document image processing; segmentation and layout analysis; word embedding and spotting; text detection; and font design and classification. Due to the Corona pandemic the conference was held as a virtual event . DO - 10.1007/978-3-030-57058-3 DO - 10.1007/978-3-030-57 DO - doi AB - This book constitutes the refereed proceedings of the 14th IAPR International Workshop on Document Analysis Systems, DAS 2020, held in Wuhan, China, in July 2020. The 40 full papers presented in this book were carefully reviewed and selected from 57 submissions. The papers are grouped in the following topical sections: character and text recognition; document image processing; segmentation and layout analysis; word embedding and spotting; text detection; and font design and classification. Due to the Corona pandemic the conference was held as a virtual event . T1 - Document analysis systems :14th IAPR International Workshop, DAS 2020, Wuhan, China, July 26-29, 2020, Proceedings / DA - 2020. CY - Cham, Switzerland : AU - Bai, Xiang. AU - Karatzas, Dimosthenis. AU - Lopresti, Daniel Philip. VL - 12116 CN - TA1650 PB - Springer, PP - Cham, Switzerland : PY - 2020. N1 - International conference proceedings. N1 - "The workshop was originally set to take place in Wuhan, China, in May 2020. However, given the worldwide pandemic, we decided to host DAS during July 26-29, 2020, and converted the workshop into a fully virtual event." N1 - Includes author index. ID - 940613 KW - Document imaging systems KW - Optical pattern recognition KW - Text processing (Computer science) KW - Image analysis SN - 9783030570583 SN - 3030570584 TI - Document analysis systems :14th IAPR International Workshop, DAS 2020, Wuhan, China, July 26-29, 2020, Proceedings / LK - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-57058-3 UR - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-57058-3 ER -