TY - GEN N2 - This two-volume set, LNCS 12565 and 12566, constitutes the refereed proceedings of the 6th International Conference on Machine Learning, Optimization, and Data Science, LOD 2020, held in Siena, Italy, in July 2020. The total of 116 full papers presented in this two-volume post-conference proceedings set was carefully reviewed and selected from 209 submissions. These research articles were written by leading scientists in the fields of machine learning, artificial intelligence, reinforcement learning, computational optimization, and data science presenting a substantial array of ideas, technologies, algorithms, methods, and applications. DO - 10.1007/978-3-030-64580-9 DO - doi AB - This two-volume set, LNCS 12565 and 12566, constitutes the refereed proceedings of the 6th International Conference on Machine Learning, Optimization, and Data Science, LOD 2020, held in Siena, Italy, in July 2020. The total of 116 full papers presented in this two-volume post-conference proceedings set was carefully reviewed and selected from 209 submissions. These research articles were written by leading scientists in the fields of machine learning, artificial intelligence, reinforcement learning, computational optimization, and data science presenting a substantial array of ideas, technologies, algorithms, methods, and applications. T1 - Machine learning, optimization, and data science :6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020, Revised Selected Papers. DA - 2021. CY - Cham : AU - Nicosia, Giuseppe. AU - Ojha, Varun. AU - La Malfa, Emanuele. AU - Jansen, Giorgio. AU - Sciacca, Vincenzo. AU - Pardalos, P. M. AU - Giuffrida, Giovanni. AU - Umeton, Renato. VL - 12566 CN - Q325.5 PB - Springer, PP - Cham : PY - 2021. N1 - Includes author index. ID - 959697 KW - Machine learning KW - Mathematical optimization KW - Big data SN - 9783030645809 SN - 3030645800 TI - Machine learning, optimization, and data science :6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020, Revised Selected Papers. LK - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-64580-9 UR - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-030-64580-9 ER -