subjectheading:[Integrated circuits -- Reliability.] - Search Results - University of Southern Indiana

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1.	Circuit design for reliability [electronic resource] / Ricardo Reis, Yu Cao, Gilson Wirth, editors. Reis, Ricardo A. L. (Ricardo Augusto da Luz), editor.; Cao, Yu (Computer scientist[...] New York, NY : Springer, [2014] ©2015 TK7874 \| View e-resource \| Available Online \| Detailed record - Similar records
2.	ESD : failure mechanisms and models / Steven H. Voldman. Voldman, Steven H. Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. TK7871.852 .V65 2009 \| View e-resource \| Available Online \| Detailed record - Similar records
3.	Lifetime reliability-aware design of integrated circuits / Mohsen Raji, Behnam Ghavami. Raji, Mohsen.; Ghavami, Behnam. Cham : Springer, [2023]. TK7874 \| View e-resource \| Available Online \| Detailed record - Similar records
4.	Design for testability, debug and reliability : next generation measures using formal techniques / Sebastian Huhn, Rolf Drechsler. Huhn, Sebastian.; Drechsler, Rolf. Cham : Springer, 2021. TK7874 \| View e-resource \| Available Online \| Detailed record - Similar records

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