subjectheading:[Materials -- Microscopy.] - Search Results - University of Southern Indiana

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1.	Miniaturized testing of engineering materials / V. Karthik, K.V. Kasiviswanathan, Baldev Raj. Karthik, V., author.; Kasiviswanathan, K. V., author.; Raj, Baldev, 1947-2018 author[...] Boca Raton, FL : CRC Press, Taylor & Francis Group, [2017] TA417.23 .K37 2017 \| View e-resource \| Available Online \| Detailed record - Similar records
2.	Surface microscopy with low energy electrons [electronic resource] / Ernst Bauer. Bauer, Ernst, author. New York, NY : Springer, 2014. TA417.23 \| View e-resource \| Available Online \| Detailed record - Similar records
3.	Transmission electron microscopy : a textbook for materials science / David B. Williams and C. Barry Carter. Williams, David B. (David Bernard), 1949- author.; Carter, C. Barry, author. New York, [New York] : Springer Science+Business Media, LLC, 1996. ©1996 TA417.23 .W555 1996 \| View e-resource \| Available Online \| Detailed record - Similar records
4.	Microstructural design of advanced engineering materials [electronic resource] / Dmitri A. Molodov. Molodov, Dmitri A. Chichester, West Sussex ; Hoboken, NJ : Wiley-VCH, c2013. TA417.23 .N24 2013eb \| View e-resource \| Available Online \| Detailed record - Similar records
5.	Scanning probe microscopy for industrial applications : nanomechanical characterization [electronic resource]/ edited by Dalia G. Yablon. Yablon, Dalia G., 1975- Hoboken, New Jersey : Wiley, 2014. ©2014 TA417.23 .S336 2014eb \| View e-resource \| Available Online \| Detailed record - Similar records

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