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1.	Sensors, measurement, intelligent materials and technologies III : selected, peer reviewed papers from the 2014 3rd International Conference on S[...] International Conference on Sensors, Measurement and Intelligent Materials (3rd [...] Pfaffikon, Switzerland : Trans Tech Publications Ltd, 2015. ©2015 TA165 .I584 2015eb \| View e-resource \| Available Online \| Detailed record - Similar records
2.	Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instru[...] International Conference on Measurement, Instrumentation and Automation (3rd : 2[...] Zurich, Switzerland : TTP, 2014. ©2014 TA165 .I584 2014eb \| View e-resource \| Available Online \| Detailed record - Similar records
3.	Advanced mathematical & computational tools in metrology VII [electronic resource] / editors, P. Ciarlini ... [et al.]. Ciarlini, P. New Jersey : World Scientific, c2006. QA465 .A273 2006eb \| View e-resource \| Available Online \| Detailed record - Similar records
4.	Proceedings of the John Hall Symposium [electronic resource] : in honor of John Hall on the occasion of his 70th birthday : University of Colorad[...] John Hall Symposium (2004 : University of Colorado, Boulder); Bergquist, James Cha[...] Singapore ; Hackensack, N.J. : World Scientific, c2006. QC446.15 .J64 2004eb \| View e-resource \| Available Online \| Detailed record - Similar records
5.	Proceedings of 2019 International Conference on Optoelectronics and Measurement / edited by Yingquan Peng, Xinyong Dong. International Conference on Optoelectronics and Measurement (2nd : 2019 : Hangzh[...] Singapore : Springer, 2021. TA1750 .I58 2019 \| View e-resource \| Available Online \| Detailed record - Similar records
6.	Reference materials in measurement and technology : proceedings of the Third International Scientific Conference / Sergei V. Medvedevskikh, Olga [...] International Scientific Conference "Reference Materials in Measurement and[...] Cham : Springer, 2020. QC81 \| View e-resource \| Available Online \| Detailed record - Similar records
7.	Proceedings of 2018 International Conference on Optoelectronics and Measurement Peng, Yingquan.; Dong, Xinyong. Singapore : Springer, 2020. TA1750 \| View e-resource \| Available Online \| Detailed record - Similar records
8.	Proceedings of the 12th International Conference on Measurement and Quality Control : cyber physical issue : IMEKO TC 14 2019 / editors, Vidosav [...] International Conference on Measurement and Quality Control (12th : 2019 : Belgr[...] Cham : Springer, [2019] ©2019 T50 \| View e-resource \| Available Online \| Detailed record - Similar records
9.	Advanced mathematical & computational tools in metrology VI [electronic resource] / editors, P. Ciarlini ... [et al.]. Ciarlini, P. Singapore ; River Edge, NJ : World Scientific, c2004. QA465 .A273 2004eb \| View e-resource \| Available Online \| Detailed record - Similar records
10.	Advanced mathematical & computational tools in metrology & testing VIII [electronic resource] / editors, F. Pavese ... [et al.]. AMCTM VIII (2008 : Paris, France); Pavese, Franco. Singapore ; Hackensack, NJ : World Scientific, c2009. QA465 .A58 2008eb \| View e-resource \| Available Online \| Detailed record - Similar records

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